Xun is currently working as Inventor SDET Ⅲ at Autodesk, Inc. He is driven next generation of testing strategy which helps Inventor QA team to win Innovation Award in 2016. He is the presenter and one member of committee of panel for AHP based defect rating system in TiD 2015. With the ecosystem, Inventor quality is improved persistently from NPS 21 in Inventor 2013 to 62 in Inventor 2017. He is presenter of Autodesk technical summit and Autodesk University 2016, 2014 and 2012. Previously, he used to work on several projects such as Customer success, AnyCAD, Direct manipulator, Consistent material, Ease of Assembly and Ease of modeling, etc.
议题：Machine learning from big data analysis based sustainable quality improvement
Hero product is facing fast iteration and high quality which request next generation of ongoing testing strategy which is based on machine learning of big data analysis to enhance quality shape which is benefit to entire Engineering team. The key outputs for such machine learning based big data analysis can help QA team to ensure sustainable quality improvement in term of: Smart defect and new function iteration rating, Dynamically quality rating, Smart indicate current high risk areas and Smart generate MTBF calculating, etc.